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© Dr. Ann Kathrin Bergmann

Instruments

The CFEM is equipped with two transmission electron microscopes, a scanning electron microscope, and a focused ion beam scanning electron microscope (FIB-SEM).

An adequately equipped electron microscopy laboratory is available for sample preparation. For sectioning, a Leica EM Ultracut 7 and a Reichert/Jung ultramicrotome are used, along with a Reichert/Jung TM60 trimming device.

For SEM sample preparation, a critical point dryer and sputter coater are available.

The FIB-SEM enables precise milling and slicing of volume samples for 3D reconstruction at the nanometer scale of cells and tissues. In addition to conventional scanning electron microscopy (SEM), focused ion beam (FIB) milling is used to remove material layer by layer (slice & image), creating images of the sample, which can be used to do a 3D reconstruction of the volume. The system is suitable for both biological and materials science samples.

Year of Manufacture: 2020
Installation: 2020
Acceleration Voltage: up to 30 kV
Detectors: EsB, InLens, SE2, EBSD
Software: SmartSEM, SmartFIB, Atlas 5

© UKD

The Hitachi H-7100 is a reliable transmission electron microscope with an acceleration voltage of 25 – 125 kV and high resolution. It is well-suited for biological and materials science samples due to its excellent illumination and imaging capabilities. Its high stability and ease of use make it ideal for teaching purposes.

Year of Manufacture: 1990
Installation: 2019
Acceleration Voltage: 25 – 125 kV
Filament: Tungsten
Software: iTEM

© UKD

The Hitachi S-4500 is equipped with a cold field emission cathode and offers an acceleration voltage range of 0.5 – 30 kV. It is particularly suitable for surface examination of samples in various scientific fields. An infrared camera is integrated for easier sample exchange, and a digital camera enables image capture during the analysis.

Year of Manufacture: 1996
Installation: 2019
Acceleration Voltage: 0.5 – 30 kV

© UKD

The JEOL JEM-2100plus with LaB6 cathode is suitable for conventional TEM imaging as well as electron tomography. In this technique, image series are captured from different tilt angles to reconstruct 3D structures. With the "High-Tilt" holder, tilt angles of ± 80° are possible. The SerialEM software enables convenient and semi-automated aquisition of tilt series and larger image montages.

Year of Manufacture: 2018
Installation: 2019
Acceleration Voltage: 80 – 200 kV
Filament: LaB6
Camera: Matataki Flash (2048 x 2048 pixels)
Software: TEMCenter, SerialEM

Features:

Motorized objective aperture
Sample holder for tomography (± 80°)

© UKD